Cover image for Test pattern generation for combinational multiplier interconnects
Title:
Test pattern generation for combinational multiplier interconnects
Personal Author:
Publication Information:
2008
Physical Description:
xiv. 40p. : ill. ; 30cm.
General Note:
Supervisor : Prof. Dr. Muhammad Nadzir Marsono
Added Corporate Author:
DSP_DISSERTATION:
Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Komputer)) - Universiti Teknologi Malaysia, 2008

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FKE Library FKE30000003624 TK7874 N87 2008 raf Closed Access Thesis UTM Project Paper (Closed Access)
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PRZS 30000010223798 TK7874 N87 2008 raf Closed Access Thesis UTM Project Paper (Closed Access)
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